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1

Nitrogen, phosphorus, and sulfur tri-doped hollow carbon shells derived from ZIF-67@poly (cyclotriphosphazene-co-4, 4′-sulfonyldiphenol) as a robust catalyst of peroxymonosulfate activation for degradation of bisphenol A

Ma, Wenjie, Wang, Na, Tong, Tianze, Zhang, Leijiang, Lin, Kun-Yi Andrew, Han, Xijiang, Du, Yunchen

Journal:

Year:

2018

Language:

english

File:

PDF, 4.47 MB

english, 2018

2

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Adaptive Low Shift Power Test Pattern Generator for Logic BIST

Lin, Xijiang, Rajski, Janusz

Year:

2010

Language:

english

File:

PDF, 252 KB

english, 2010

3

High-frequency, at-speed scan testing

Xijiang Lin,, Press, R., Rajski, J., Reuter, P., Rinderknecht, T., Swanson, B., Tamarapalli, N.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 293 KB

english, 2003

4

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Programmable Logic BIST for At-speed Test

Huang, Yu, Lin, Xijiang

Year:

2007

Language:

english

File:

PDF, 393 KB

english, 2007

5

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Programmable Logic BIST for At-speed Test

Huang, Yu, Lin, Xijiang

Year:

2007

Language:

english

File:

PDF, 393 KB

english, 2007

6

The Stability and Survival Rate of Dental Implants After Preparation of the Site by Piezosurgery vs Conventional Drilling: A Systematic Review and Meta-Analysis

Li, Xiaoni, Lin, Xijiang, Guo, Jilai, Wang, Yaozhong

Journal:

The International Journal of Oral & Maxillofacial Implants

Year:

2020

File:

PDF, 139 KB

2020

7

Facile Synthesis of Polyaniline-Polypyrrole Nanofibers for Application in Chemical Deposition of Metal Nanoparticles

Ping Xu, Xijiang Han, Chao Wang, Bin Zhang, Xiaohong Wang, Hsing-Lin Wang

Journal:

Macromolecular Rapid Communications

Year:

2008

Language:

english

File:

PDF, 839 KB

english, 2008

8

Synthesis and characterization of nanostructured polypyrroles: Morphology-dependent electrochemical responses and chemical deposition of Au nanoparticles

Ping Xu, Xijiang Han, Bin Zhang, Nathan H. Mack, Sea-Ho Jeon, Hsing-Lin Wang

Journal:

Year:

2009

Language:

english

File:

PDF, 538 KB

english, 2009

9

Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells

Xijiang Lin, Yu Huang

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 205 KB

english, 2008

10

Fast fabrication of homogeneous silver nanostructures on hydrazine treated polyaniline films for SERS applications

He, Jiaojiao, Han, Xijiang, Yan, Jun, Kang, Leilei, Zhang, Bin, Du, Yunchen, Dong, Cunku, Wang, Hsing-Lin, Xu, Ping

Journal:

Year:

2012

Language:

english

File:

PDF, 817 KB

english, 2012

11

Low-Power Scan Operation in Test Compression Environment

Czysz, D., Kassab, M., Xijiang Lin, Mrugalski, G., Rajski, J., Tyszer, J.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2009

Language:

english

File:

PDF, 1.13 MB

english, 2009

12

On Reducing Scan Shift Activity at RTL

Alpaslan, E., Yu Huang, Xijiang Lin, Wu-Tung Cheng, Dworak, J.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 4.94 MB

english, 2010

13

Scan-Based Tests with Low Switching Activity

Remersaro, S., Xijiang Lin, Reddy, S.M., Pomeranz, I., Rajski, J.

Journal:

IEEE Design & Test of Computers

Year:

2007

Language:

english

File:

PDF, 270 KB

english, 2007

14

Fabrication of Thorny Au Nanostructures on Polyaniline Surfaces for Sensitive Surface-Enhanced Raman Spectroscopy

Li, Siwei, Xu, Ping, Ren, Ziqiu, Zhang, Bin, Du, Yunchen, Han, Xijiang, Mack, Nathan H., Wang, Hsing-Lin

Journal:

ACS Applied Materials & Interfaces

Year:

2013

Language:

english

File:

PDF, 1.46 MB

english, 2013

15

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Power Aware Embedded Test

Lin, Xijiang, Moghaddam, Elham, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Tyszer, Jerzy

Year:

2011

File:

PDF, 1.50 MB

2011

16

[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Lin, Xijiang, Tsai, Kun-han, Wang, Chen, Kassab, Mark, Rajski, Janusz, Kobayashi, Takeo, Klingenberg, Randy, Sato, Yasuo, Hamada, Shuji, Aikyo, Takashi

Year:

2006

Language:

english

File:

PDF, 249 KB

english, 2006

17

Amino Acid-Assisted Synthesis of Hierarchical Silver Microspheres for Single Particle Surface-Enhanced Raman Spectroscopy

Kang, Leilei, Xu, Ping, Chen, Dengtai, Zhang, Bin, Du, Yunchen, Han, Xijiang, Li, Qing, Wang, Hsing-Lin

Journal:

The Journal of Physical Chemistry C

Year:

2013

Language:

english

File:

PDF, 969 KB

english, 2013

18

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Generation for Timing-Critical Transition Faults

Lin, Xijiang, Kassab, Mark, Rajski, Janusz

Year:

2007

Language:

english

File:

PDF, 321 KB

english, 2007

19

Test compaction for small-delay defects using an effective path selection scheme

Xiang, Dong, Li, Jianbo, Chakrabarty, Krishnendu, Lin, Xijiang

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2013

Language:

english

File:

PDF, 378 KB

english, 2013

20

The Electromagnetic Shielding Effectiveness of a Low-Cost and Transparent Stainless Steel Fiber/Silicone Resin Composite

Jin, Lin, Haiyan, Zhang, Ping, Li, Xijiang, Yin, Guoxun, Zeng

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2014

Language:

english

File:

PDF, 720 KB

english, 2014

21

The accelerated de-dispersion and sedimentation behaviors of multi walled carbon nanotube suspensions using surfactants

Jin, Lin, Haiyan, Zhang, Ping, Li, Xijiang, Yin, Aikseng, Low

Journal:

Materials Chemistry and Physics

Year:

2013

Language:

english

File:

PDF, 1.29 MB

english, 2013

22

Field-assisted synthesis of SERS-active silver nanoparticles using conducting polymers

Xu, Ping, Jeon, Sea-Ho, Mack, Nathan H., Doorn, Stephen K., Williams, Darrick J., Han, Xijiang, Wang, Hsing-Lin

Journal:

Year:

2010

Language:

english

File:

PDF, 313 KB

english, 2010

23

Facile Synthesis and Electrical Properties of Silver Wires through Chemical Reduction by Polyaniline

Xu, Ping, Jeon, Sea-Ho, Chen, Hou-Tong, Luo, Hongmei, Zou, Guifu, Jia, Quanxi, Anghel, Marian, Teuscher, Christof, Williams, Darrick J., Zhang, Bin, Han, Xijiang, Wang, Hsing-Lin

Journal:

The Journal of Physical Chemistry C

Year:

2010

Language:

english

File:

PDF, 3.35 MB

english, 2010

24

Facile Fabrication of Homogeneous 3D Silver Nanostructures on Gold-Supported Polyaniline Membranes as Promising SERS Substrates

Xu, Ping, Mack, Nathan H., Jeon, Sea-Ho, Doorn, Stephen K., Han, Xijiang, Wang, Hsing-Lin

Journal:

Year:

2010

Language:

english

File:

PDF, 944 KB

english, 2010

25

[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - EMI shielding effectiveness of carbon nanotubes based composites

Li, Ping, Shan, Yueyan, Yin, Xijiang, Jin, Lin, Deng, Junhong

Year:

2012

Language:

english

File:

PDF, 683 KB

english, 2012

26

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Remersaro, Santiago, Lin, Xijiang, Zhang, Zhuo, Reddy, Sudhakar, Pomeranz, Irith, Rajski, Janusz

Year:

2006

Language:

english

File:

PDF, 11.73 MB

english, 2006

27

[IEEE 2003. Design Automation Conference - Anaheim, CA, USA (2-6 June 2003)] Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) - Test generation for designs with multiple clocks

Xijiang Lin,, Thompson, R.

Year:

2003

Language:

english

File:

PDF, 666 KB

english, 2003

28

Highly Sensitive Surface-Enhanced Raman Spectroscopy (SERS) Platforms Based on Silver Nanostructures Fabricated on Polyaniline Membrane Surfaces

Yan, Jun, Han, Xijiang, He, Jiaojiao, Kang, Leilei, Zhang, Bin, Du, Yunchen, Zhao, Hongtao, Dong, Cunku, Wang, Hsing-Lin, Xu, Ping

Journal:

ACS Applied Materials & Interfaces

Year:

2012

Language:

english

File:

PDF, 1.14 MB

english, 2012

29

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - Scan Tests with Multiple Fault Activation Cycles for Delay Faults

Zhuo Zhang,, Reddy, S.M., Pomeranz, I., Xijiang Lin,, Rajski, J.

Year:

2006

Language:

english

File:

PDF, 291 KB

english, 2006

30

[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings - Munich, Germany (9-12 March 1999)] Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) - Full scan fault coverage with partial scan

Xijiang Lin,, Pomeranz, I., Reddy, S.M.

Year:

1999

Language:

english

File:

PDF, 172 KB

english, 1999

31

Synthesis of homogeneous silver nanosheet assemblies for surface enhanced Raman scattering applications

Xu, Ping, Zhang, Bin, Mack, Nathan H., Doorn, Stephen K., Han, Xijiang, Wang, Hsing-Lin

Journal:

Journal of Materials Chemistry

Year:

2010

Language:

english

File:

PDF, 316 KB

english, 2010

32

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains

Waayers, Tom, Morren, Richard, Lin, Xijiang, Kassab, Mark

Year:

2010

Language:

english

File:

PDF, 685 KB

english, 2010

33

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study

Beck, M., Barondeau, O., Poehl, F., Xijiang Lin,, Press, R.

Year:

2005

Language:

english

File:

PDF, 169 KB

english, 2005

34

γ-irradiation induced one-step synthesis of electromagnetic functionalized reduced graphene oxide–Ni nanocomposites

Zhao, Hongtao, Li, Zhigang, Zhang, Nan, Du, Yunchen, Li, Siwei, Shao, Lin, Gao, Deyu, Han, Xijiang, Xu, Ping

Journal:

Year:

2014

Language:

english

File:

PDF, 742 KB

english, 2014

35

[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Test Generation for Designs with On-Chip Clock Generators

Lin, Xijiang, Kassab, Mark

Year:

2009

Language:

english

File:

PDF, 428 KB

english, 2009

36

[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Test Power Reduction by Blocking Scan Cell Outputs

Lin, Xijiang, Rajski, Janusz

Year:

2008

Language:

english

File:

PDF, 258 KB

english, 2008

37

[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - Experimental results of forward-looking reverse order fault simulation on industrial circuits with scan

Pomeranz, I., Reddy, S.M., Xijiang Lin,

Year:

2001

Language:

english

File:

PDF, 139 KB

english, 2001

38

[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - The Impacts of Untestable Defects on Transition Fault Testing

Xijiang Lin,, Rajski, J.

Year:

2006

Language:

english

File:

PDF, 300 KB

english, 2006

39

Laser wavelength- and power-dependent plasmon-driven chemical reactions monitored using single particle surface enhanced Raman spectroscopy

Kang, Leilei, Xu, Ping, Zhang, Bin, Tsai, Hsinhan, Han, Xijiang, Wang, Hsing-Lin

Journal:

Chemical Communications

Year:

2013

Language:

english

File:

PDF, 14.16 MB

english, 2013

40

[IEEE 2011 International Green Computing Conference (IGCC) - Orlando, FL, USA (2011.07.25-2011.07.28)] 2011 International Green Computing Conference and Workshops - Low power testing - What can commercial DFT tools provide?

Year:

2011

Language:

english

File:

PDF, 219 KB

english, 2011

41

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - SIFAR: static test compaction for synchronous sequential circuits based on single fault restoration

Xijiang Lin,, Wu-Tung Cheng,, Pomeranz, I., Reddy, S.M.

Year:

2000

Language:

english

File:

PDF, 208 KB

english, 2000

42

[IEEE 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers - San Jose, CA, USA (7-11 Nov. 1999)] 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051) - Techniques for improving the efficiency of sequential circuit test generation

Xijiang Lin,, Pomeranz, I., Reddy, S.M.

Year:

1999

Language:

english

File:

PDF, 607 KB

english, 1999

43

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Test Generation for Interconnect Opens

Xijiang Lin,, Rajski, J.

Year:

2008

Language:

english

File:

PDF, 1.59 MB

english, 2008

44

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

Beck, M., Barondeau, O., Kaibel, M., Poehl, F., Xijiang Lin,, Press, R.

Year:

2005

Language:

english

File:

PDF, 198 KB

english, 2005

45

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - On removing redundant faults in synchronous sequential circuits

Xijiang Lin,, Pomeranz, I., Reddy, S.M.

Year:

1998

Language:

english

File:

PDF, 217 KB

english, 1998

46

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - On static test compaction and test pattern ordering for scan designs

Xijiang Lin,, Rajski, J., Pomeranz, I., Reddy, S.M.

Year:

2001

Language:

english

File:

PDF, 1.00 MB

english, 2001

47

[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Novel techniques for achieving high at-speed transition fault test coverage for Motorola's microprocessors based on PowerPC/spl trade/ instruction set architecture

Tendolkar, N., Raina, R., Woltenberg, R., Xijiang Lin,, Swanson, B., Aldrich, G.

Year:

2002

Language:

english

File:

PDF, 252 KB

english, 2002

48

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Low capture power at-speed test in EDT environment

Moghaddam, Elham K., Rajski, Janusz, Reddy, Sudhakar. M., Lin, Xijiang, Mukherjee, Nilanjan, Kassab, Mark

Year:

2010

Language:

english

File:

PDF, 363 KB

english, 2010

49

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Power Supply Droop and Its Impacts on Structural At-Speed Testing

Year:

2012

Language:

english

File:

PDF, 377 KB

english, 2012

50

Mechanistic understanding of surface plasmon assisted catalysis on a single particle: cyclic redox of 4-aminothiophenol

Xu, Ping, Kang, Leilei, Mack, Nathan H., Schanze, Kirk S., Han, Xijiang, Wang, Hsing-Lin

Journal:

Scientific Reports

Year:

2013

Language:

english

File:

PDF, 2.93 MB

english, 2013